ExLibris header image
SFX logo
language bar corner

SFX K.UTB Link Resolver

Contains information about title and source of a journal
Title: Nanoscale characterization of ultra-thin tungsten films deposited by radio-frequency magnetron sputtering
Source:

Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on [1-4673-8157-8; 1-4673-8156-X] Martínek

yr:2015 pg:510 -513

List of services to meet your request

Contains list of services for current record
service type icon, opens target in new window
Full text available via
IEEE Electronic Library (IEL)


© 2024 SFX by Ex Libris Inc. | Cookie Policy