Language:
English
Česky
SFX K.UTB Link Resolver
Contains information about title and source of a journal
Title:
Characterization of ultra-thin tungsten layers
Source:
International Journal of Applied Engineering Research [0973-4562] Martínek, Tomáš yr:2016 vol:11 iss:11 pg:7523 -7525
List of services to meet your request
Contains list of services for current record
Request document via
Interlibrary Loan Service
© 2024 SFX by Ex Libris Inc. |
Cookie Policy