ExLibris header image
SFX logo
language bar corner

SFX K.UTB Link Resolver

Contains information about title and source of a journal
Title: Characterization of ultra-thin tungsten layers
Source:

International Journal of Applied Engineering Research [0973-4562] Martínek, Tomáš yr:2016 vol:11 iss:11 pg:7523 -7525

List of services to meet your request

Contains list of services for current record
service type icon, opens target in new window


© 2024 SFX by Ex Libris Inc. | Cookie Policy